Test item：High Temperature Reverse Biased Test（HTRB）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：max. temp. up to 200℃；max. voltage up to 2000V
Executive Standard ：JEDEC，AEC or special request from customer.
Test item： High Temperature, High Humidity Reverse Biased (H3TRB)
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Temp. ranged from 45 ℃ ~150℃, max. voltage up to 300V
Executive Standard ：JEDEC，AEC or special request from customer.
Test item：High Temperature Operating Life (HTOL)
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Max. temp. up to 200℃；max. current up to 60A
Executive Standard ：JEDEC，AEC or special request from customer.
Test item：Pressure Cooker Test（PCT）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Temp. 121℃, Humidity 100%, pressure: 1 atm.
Executive Standard：JEDEC，AEC or special request from customer.
Test item：High Temperature Storage Life (HTSL)
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Max. temp. up to 300℃
Executive Standard ：GB; JEDEC，AEC or special request from customer
Test item：Intermittent Operating Life (IOL）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：ΔTj≧100℃ , Max. voltage up to 80V，Max. current up to 60A
Executive Standard：MIL; AEC or special request from customer.
Test item：Pre-conditioning（Pre-con）
Product covered：All surface mount package semi-conductor devices
Test capability：Equipment can fulfil all MSLs evaluation requirement
Executive Standard：JEDEC，AEC or special request from customer
Test item：Highly Accelerated Stress Test（HAST）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Temp. 130℃/110℃, Relative humidity 85%,Max. voltage up to 2000V
Executive Standard：JEDEC，AEC or special request from customer.
Test item：Moisture Sensitive Level（MSL）
Product covered：All surface mount package semi-conductor devices
Test capability：Equipment can fulfil all MSLs evaluation requirement
Executive Standard：JEDEC or special request from customer.
Test item：Low Temperature Storage Life（LTSL）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete Semi-conductor devices.
Test capability：Temp. Min. up to -75 ℃
Executive Standard：JEDEC，AEC or special request from customer.
Test item：Solderability Test
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Both lead- or lead-free devices
Executive Standard：JEDEC，AEC or special request from customer.
Test item：Temperature Cycling Test（TCT）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Temp. ranged ：-75℃~250℃
Executive Standard：MIL; AEC or special request from customer.
Test item：High Temperature Gate Bias（HTGB）
Product covered：MOSFET、 IGBT等分立器件
Test capability：Max. temp up to 150℃； Max. voltage up to 2000V
Executive Standard：JEDEC，AEC or special request from customer.
Test item：Unbiased Highly Accelerated Stress Test(UHAST）
Product covered：MOSFET、IGBT、DIODE、Transistor、SCR and discrete semi-conductor devices.
Test capability：Temp. 130℃/110℃, Humidity 85%, Pressure: 250kPa
Executive Standard：JEDEC，AEC or special request from customer.
Test item：Power Testfor Module
Product covered：IGBT/Diodes/SCR module
Test capability：Current 500A / Voltage 20V
Executive Standard：MIL or special request from customer.
Test item：High Temperature Reverse Bias Test for module（HTRB）
Product covered：IGBT/Diodes/SCR module
Test capability：Max. voltage up to 3000V
Executive Standard：MIL or special request from customer.
