Experiment Center
WeEn Semiconductor Experiment Center has a domestic first-class semi-conductor device reliability evaluation and failure analysis laboratory, and the laboratory projects refer to the relevant JEDEC standards. There are two main businesses: reliability evaluation experiment and failure analysis experiment.
The center was certified by CNAS in 2019. It is the only electronic component company in Jiangxi Province with a CNAS accreditation certificate from the China National Accreditation Service for Conformity Assessment.
WeEn Semiconductors Technology Co., Ltd. Experiment Center
Address：Nanchang, Jiangxi, China
Telephone：+86 0791-85952909
Reliability evaluation experiment
RELIABILITTY TEST LAB
Reliability is the most basic and important quality characteristic of a product. The laboratory is established in
accordance with industry international standards and has complete experimental capabilities. It can conduct
reliability growth tests, reliability qualification tests, endurance life tests, etc. of electronic products, and
can conduct customized reliability experiments according to customer needs
Failure analysis experiment
FA TEST LAB
For failed or defective components, use electrical parameter test analysis techniques and follow the analysis
procedures to confirm their failure phenomena; distinguish failure modes or mechanisms; determine their ultimate
failure causes; propose improvements and preventive measures and improve product design and process technology.
Reduce invalidation and arbitration invalidation accidents play an extremely important role
